Automatic processing in moiré deflectometry by local fringe direction calculation

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Automatic processing in moiré deflectometry by local fringe direction calculation.

An algorithm for accurately extracting the local fringe direction is presented. The algorithm estimates, in the neighborhood of n x n points, the direction of the gradient that points normal to the local fringe direction. The performance of four different derivative kernels is also compared. Since this method is sensitive to noise and variations in background and amplitude, a preprocessing step...

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16 Moiré and Fringe Projection Techniques

The term “moiré” is not the name of a person; in fact, it is a French word referring to “an irregular wavy finish usually produced on a fabric by pressing between engraved rollers” (Webster's 1981). In optics it refers to a beat pattern produced between two gratings of approximately equal spacing. It can be seen in everyday things such as the overlapping of two window screens, the rescreening o...

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Improved phase-shifting method for automatic processing of moiré deflectograms.

An improved moiré deflectometry phase-shifting technique is presented. A squared grating is used to multiplex the information of the deflections in two orthogonal directions in one image. This procedure avoids the need to rotate the gratings to obtain complete deflection information. However, the use of these gratings makes impossible the application of standard phase-shifting algorithms. Speci...

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Sub-20-nm alignment in nanoimprint lithography using Moiré fringe.

Accurate multi-level overlay capability for nanoimprint lithography (NIL) is essential to integrated circuit manufacturing and other multilayer imprint applications. Using the "beat" grating image (Moiré fringe) generated by overlaying two sets of gratings that have slightly different periods, we obtained an alignment signal with a sensitivity better than 10 nm in nanoimprint lithography. The a...

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Local fringe density determination by adaptive filtering.

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ژورنال

عنوان ژورنال: Applied Optics

سال: 1998

ISSN: 0003-6935,1539-4522

DOI: 10.1364/ao.37.005894